Test – Adapters for “digitaltest Systems“ 

Variable Adapter-Module  “Vacuum“ - VAM 60 MTS 300

VAM 60 consists of a base unit, in which exchange cartridges or exchange plates can be integrated easily with just one flick of the wrist. An internal vacuum spring-pin interface for a maximum of 1,152 pins establishes the connection to the exchange cartridge. The contact path is driven by means of a vacuum frame with retainer (hold-down) system (VAN) or via the vacuum exchange cartridge (VAV) itself. The special requirement is for problem-specific contacting of the tested PCBs, either by means of vacuum or by using a hold-down system. Interfaces to other MTS test systems have been implemented.

 

 

VAM 30 MTS 840

VAM 30 consists of a base unit, in which exchange cartridges or exchange plates can be integrated easily with just one flick of the wrist. An internal vacuum spring-pin interface for a maximum of 960 pins establishes the connection to the exchange cartridge. The contact path is driven by means of a vacuum frame with retainer system (VAN) or via the vacuum exchange cartridge (VAV) itself.

The special requirement is for problem-specific contacting of the tested PCBs, either by means of vacuum or by using a retainer system. Interfaces to other MTS test systems have been implemented.

VC 30  MTS 300 Tandem

The vacuum cartridge is typically sealed with an antistatic silicone mask sealing.
The tested PCB in our example necessitates a lightproof cover in order to avoid unwanted light when testing coloured LEDs and displays.

Both tandem cartridges can be folded out separately for convenient and quick handling.

VC 30 MTS 300

Vacuum adapter with antistatic cover and OPENS sensor probes for testing complex components. Just as all TEST-STEP adapters, this type allows two-sided contacting and “two-stage contacting” (DUO) for ICT and FCT testing.

Test – Adapters for “digitaltest Systems“

Variable Adapter-Module “Pneumatic“ – “redline MTS 300“

Base Unit “redline”
Suitable for exchange cartridges “TC 30” or exchange plates “TP 30 – 410”.
An internal plug interface connects these cartridges or exchange plates with the test system. The interface is equipped with 6 ea. 96-pole VG terminal strips. Optionally, an expansion to 9 plugs is possible. Best results can be achieved by means of a spring-pin interface, which is driven pneumatically or manually by means of a precise 4-point drive. This space-saving mechanical drive system is based on the “inclined plane” principle. Hold-down systems are available in different (slide and carrier), or specific retainers adapted to the individual type of test specimen, or retainer frames. Interfaces to other MTS test systems are also available.

„redline MTS 60“

“redline” base unit (adapter frame) with internal plug interface and “base/standard cartridge with retainer”. The base unit and base cartridge will form one unit when combined with adapter plates of the type “TP 30 – 410”. The standard cartridge can be replaced with an exchange cartridge at any time. The retainer frame is also an integral part of the base unit. The exchange plate adjusts in accordance with the PCB to be tested. The retainer (hold-down) pins can be adjusted in an x – y direction, or the complete hold-down plate can be adjusted and inserted in the retainer frame.   
After inserting the exchange plate and adjusting the retainer the adapter is ready for testing.

“redline with exchange plate“

Exchange plate “TP 30 - 410” with or without hold-down plate, depending on the configuration of the base unit. The adjustments are made on a support plate, which is specifically adapted to the test specimen. In this way, better support of the PCB is ensured, and the spring pins are completely protected.

“redline Spring-Pin Interface“

Internal spring-pin and pneumatic interface connection. Spring-pins for MUX pins, power and RF signals, enabling variable assembly. Up to 864 MUX pins can be contacted.

 

Test – Adapter for “digitaltest“ Systems 

VC 30 MTS 60

Vacuum adapter for MTS 60 test system, typically sealed by means of an antistatic silicone mask. Our example shows contacting “from the top” by means of spring pins, and “OPENS” test via an additional pneumatically driven mechanical system. The pneumatics is activated after the contacting stroke of the vacuum cartridge.
The upper contact carrier plate with the spring pins and OPENS sensor probes is guided onto the test specimen.

VC 30 MTS 100

Vacuum adapter for MTS 100 Test system for “from the TOP“ contacting by means of spring pins and “OPENS“ test and additional vacuum cartridge, which acts from the top. The contacting stroke is initiated by the test system after the upper cartridge is slewed in. The test specimen is contacted by the spring pins in a linear movement from “top to bottom”.

VC 30 MTS 200

Vacuum adapter for MTS 200 Test system, typically sealed with an antistatic silicone mask. Our example shows transfer fields for testing cable connections. The wiring is established in single-ww or twisted-pair technique.

VC 30 MTS 840

Vacuum adapter for MTS 840 Test system, typically sealed with an antistatic silicone mask. Wiring in single-ww or twisted-pair technique.